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Imported Testing Machines |
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C-56, Jhandewalan Flatted
Factories Complex,
New Delhi-110 055
Phone: +91-11-23636708
Fax: +91-11–23636824
Unit-II: Plot No.742-D,
Place City-II, Sector-37
Gurgaon-122 001, Haryana
Phone: +91-120-4705400
Fax: +91-124 – 4705419 |
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Company: Matelect (visit: http://www.matelect.com/)
Matelect Ltd. designs and manufacturers precision scientific instruments for research and industry. Our principal products are potential drop instruments for the measurement of crack initiation and propagation in metals.
» read more |
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CGM-7 Crack Growth Monitor
The CGM-7 is a modern microprocessor based instrument for measuring crack depth in metals undergoing materials testing using the alternating current potential drop (ACPD) method which is an established technique covered by the ASTM 647 standard. Matelect has established itself as the world's foremost designer and manufacturer of stand-alone laboratory ACPD equipment. The CGM-7 is the most advanced and highly specified ACPD instrument that Matelect produce. It is housed in a portable enclosure and employs the phase sensitive detection technique to process potential drop signals generated by the passage of an internally sourced, high stability alternating current. |
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The unit is microprocessor based with set parameters accessed through a user friendly menu system and graphics screen or via a PC link. Its upper frequency and current capability have been greatly enhanced over earlier instruments and now make the CGM-7 the first choice for demanding scientific and industrial applications. Matelect produce a range of peripherals to support the CGM-7 and have also built up many years of experience in the ACPD technique.
CGM-7 Features
• Continuously variable frequency output from 10Hz to 500kHz in 1Hz increments.
• High output currents up to 5 amps. Continuously variable in 1mA increments.
• Advanced filtering capabilities with 4 user selectable ranges.
• User selectable offsets. Continuously variable from –4v to +4v.
• 9 pre-set gains built in. User selectable from 1000 to 30000.
• Resistive and inductive components simultaneously displayed.
• Two channels as standard on all models.
• Pre-amplifiers provided as standard for each channel for superior SNR.
Applications
• Slow crack growth
• Crack initiation
• Crack sizing
• Fatigue crack initiation
• Dynamic crack growth studies
• Condition monitoring
• Crack closure studies
• Stress corrosion testing
The CGM-7 is now available in a wide range of specifications as outlined below |
| CGM-7 Model range. |
| Option1 |
2A Max current output and up to 100kHz max frequency. |
| Option2 |
2A Max current output and up to 240kHz max frequency. |
| Option3 |
5A Max current output and up to 100kHz max frequency. |
| Option4 |
5A Max current output and up to 240kHz max frequency. |
| Option5 |
5A Max current output and up to 500kHz max frequency. |
| Option6 |
2A Max current output and 10Hz to 100kHz max frequency. |
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| Download specifications of this product. (154Kb) |
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DCM-2 DC Crack Growth Monitor
The DCM-2 is a modern microprocessor based instrument for measuring crack depth in metals undergoing materials testing. Building on the success of the DCM-1 this new unit takes on board customer comments and suggestions, as shown in its impressive features list.
It utilises the pulsed direct current potential drop method (DCPD) which is an established technique covered by the ASTM 647 standard. The technique involves passing a constant current through the metal under test and measuring the resultant voltage drop that is created across the specimen. The presence of a growing defect will alter this voltage and by suitable calibration, a measure of the defect depth can be obtained. |
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DCM-2 Features
• Capable of reverse DCPD.
• Pulsed DCPD as standard.
• Advanced filtering options. The unit has highly advanced sampling and filtering options please call for details.
• Advanced triggering (Optional), including peak, trough, and mid-point of load cycle waveform input.
• High Current O/P, up to 50A. Variable in steps of 10mA.
• Variable DC offsets for the removal of standing voltages.
• Built in scan controller, for direct control of high current scanners.(Optional)
• Two channels as standard, reference and specimen.
Download specifications of this product.(140Kb) |
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